Research for practical issues and solutions in computerized multistage testing / 
edted by Duanli Yan. 
 - New York :  Routledge,  2025. 
 - xvi, 499 pages ;  23 cm 
<br/><br/> Includes indexes and biographical records. 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>978-0-367-20781-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Research.
<br/><br/><label>Dewey Class. No.: </label>GS/Cir. 001.4 R432 2025